Cameca LEAP 4000X HR

APT, LEAP

Name (abbreviation) of the procedure: Atom probe tomography, Local electrode atom-probe (APT, LEAP)

Generic term of the process: MS, Tomography

Physical Principle: Sputtering single atoms of a nanometer-sized tip (modeled via focused ion beam (FIB)) with a pulsed laser and detection with position sensitive TOF (time of flight) mass spectrometry

Scope: Tomography on the atomar level to visualize atom layers, clusters and

Contact

Institute: WWI

Name: T. Schirmer

Phone: +49 (0) 5323/72-2917

Information

Type: Atomprobe

Physical force/principle: Atomic level interaction, Mass spectrometry

General scope of application: 3d, Spatial, Metals, Oxidic, Surfaces, (Soft matter)

Available at: University Erlangen

Website: Atomsonde