Cameca LEAP 4000X HR
APT, LEAP
Name (abbreviation) of the procedure: Atom probe tomography, Local electrode atom-probe (APT, LEAP)
Generic term of the process: MS, Tomography
Physical Principle: Sputtering single atoms of a nanometer-sized tip (modeled via focused ion beam (FIB)) with a pulsed laser and detection with position sensitive TOF (time of flight) mass spectrometry
Scope: Tomography on the atomar level to visualize atom layers, clusters and
Information
Type: Atomprobe
Physical force/principle: Atomic level interaction, Mass spectrometry
General scope of application: 3d, Spatial, Metals, Oxidic, Surfaces, (Soft matter)
Available at: University Erlangen
Website: Atomsonde