S4 T-Star
TXRF
Name (abbreviation) of the procedure: Total Reflection X-Ray Fluorescence (TXRF)
Generic term of the process: XRF
Physical Principle: Excitation of inner electron shells to generate characteristic X-Ray radiation.
Scope: Surface sensitive method (limited spatial resolution). Uses X-Ray (energy dispersive, (EDX) fluorescence to analyze main, minor and trace compounds, typically starting from Na. Lighter elements (except for H, He) are possible but the detection limit is comparable high (X000 µg/g). Li can only be measured with special spectrometers. This method is highly surface sensitive and can be used to analyse thin films/layers.
Information
Type: XRF-Spectrometer
Physical force/principle: X-Ray
General scope of application: Surfaces, Metals, Oxidic, Solution
Available at: TU Clausthal
Website: TXRF