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TXRF

Name (abbreviation) of the procedure: Total Reflection X-Ray Fluorescence (TXRF)

Generic term of the process: XRF

Physical Principle: Excitation of inner electron shells to generate characteristic X-Ray radiation.

Scope: Surface sensitive method (limited spatial resolution). Uses X-Ray (energy dispersive, (EDX) fluorescence  to analyze main, minor and trace compounds, typically starting from Na. Lighter elements (except for H, He) are possible but the detection limit is comparable high (X000 µg/g). Li can only be measured with special spectrometers. This method is highly surface sensitive and can be used to analyse thin films/layers.

Contact

Institute: IAAC

Name: U. Fittschen

Phone: +49 5323 72-2205

Information

Type: XRF-Spectrometer

Physical force/principle: X-Ray

General scope of application: Surfaces, Metals, Oxidic, Solution

Available at: TU Clausthal

Website: TXRF