SPECS INA-X
SNMS
Name (abbreviation) of the procedure: Secondary neutral mass spectrometry (SNMS)
Generic term of the process: MS
Physical Principle: Ion sputtering and detection of neutral particles after ionisation via laser or plasma via quadrupole mass spectrometry.
Scope: Sputtering and characterisaton of layered structures of metallic alloys, compounds (oxides, sulfides etc.) and semiconductors.
Information
Type: Mass spectrometer
Physical force/principle: Mass spectrometry
General scope of application: 3d, Spatial, Metals, Oxidic, Surfaces, (Soft matter)
Available at: TU Clausthal