JEOL JEM2100
TEM
Name (abbreviation) of the procedure: Transmission electron microscope (TEM)
Generic term of the process: TEM
Physical Principle: An Instrument that mainly uses an focused electron beam to generate electron micrographs. Operated in transmission mode
Scope: Spatial resolution method. Uses BSE and SE to analyse morphology, topology and eventually EDXRF for chemical composition of small sample spots
TEM
Name (abbreviation) of the procedure: Transmission electron microscopy (TEM)
Generic term of the process: Electron spectroscopy
Physical Principle: Generation of electrons which are scattered from the sample material (BSE, primary electrons) and electrons which are removed from the material (SE, secondary electrons)
Scope: Spatial resolution method. This method is used to visualize small areas of a sample (down to 0.001 µm) via transmission of electrons via a focused electron beam providing BSE and SE images. Furthermore a focused ion beam (FIB) unit can be attached to cut or model small parts of the sample
EDXRF
Name (abbreviation) of the procedure: Energy dispersive X-ray Fluorescence (EDXRF)
Generic term of the process: XRF
Physical Principle: Excitation of inner electron shells to generate characteristic X-Ray radiation
Scope: For simple chemical characterization often a EDXRF system is attached, typically starting from F. Lighter elements (except for H, He) are possible but the detection limit is comparable high (X000 µg/g). Li can only be measured with special spectrometers.
Information
Type: Electron Microscope
Physical force/principle: X-Ray, Electron
General scope of application: Spatial, Metals, Oxidic, (Surfaces), (Soft matter)
Available at: TU Clausthal
Website: IMVT Forschung